1. New perspectives in defect centric model for NBTI reliability. (July 2019) Authors: Nouguier, D.; Ghibaudo, G.; Federspiel, X.; Rafik, M.; Roy, D. Journal: Microelectronics and reliability Issue: Volume 98(2019) Page Start: 119 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗