1. Empirical derivation of upper and lower bounds of NBTI aging for embedded cores. (January 2018) Authors: Chen, Yukai; Macii, Enrico; Poncino, Massimo Journal: Microelectronics and reliability Issue: Volume 80(2018) Page Start: 294 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗