1. A shared page-aware machine learning assisted method for predicting and improving multi-level cell NAND flash memory life expectancy. (January 2023) Authors: Santikellur, Pranesh; Buddhanoy, Matchima; Sakib, Sadman; Ray, Biswajit; Chakraborty, Rajat Subhra Journal: Microelectronics and reliability Issue: Volume 140(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗