Subject: Reliability -- InGaAs -- MOSFET -- High-k -- Logic - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Subject Reliability -- InGaAs -- MOSFET -- High-k -- Logic

1. Instability investigation of In0.7Ga0.3As quantum-well MOSFETs with Al2O3 and Al2O3/HfO2. (July 2016)

Authors:: Kwon, Hyuk-Min; Kim, Do-Kywn; Lim, Sung-Kyu; Hwang, Hae-Chul; Son, Seung Woo; Park, Jung Ho; Park, Won-Sang; Kim, Jin Su; Shin, Chan-Soo; Park, Won-Kyu; Lee, Jung Hee; Kim, Taewoo; Kim, Dae-Hyun
Journal:: Solid-state electronics
Issue:: Volume 121(2016)
Page Start:: 16
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

2. Instability investigation of In0.7Ga0.3As quantum-well MOSFETs with Al2O3 and Al2O3/HfO2. (July 2016)

Authors:: Kwon, Hyuk-Min; Kim, Do-Kywn; Lim, Sung-Kyu; Hwang, Hae-Chul; Son, Seung Woo; Park, Jung Ho; Park, Won-Sang; Kim, Jin Su; Shin, Chan-Soo; Park, Won-Kyu; Lee, Jung Hee; Kim, Taewoo; Kim, Dae-Hyun
Journal:: Solid-state electronics
Issue:: Volume 121(2016)
Page Start:: 16
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗