41. Characteristics of electric infra-red emitters for industrial heating. Short wave infra-red emitters Part 1, (15th November 1994) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (14 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
42. Crystalline silicon photovoltaic (PV) array. On-site measurement of I-V characteristics. (15th December 1998) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (14 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
43. Detail specification for flat rectangular (8.33:1) rigid waveguide tubing. Standard wall thickness. General application category. (15th March 1971) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (10 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
44. Detail specification for medium flat rectangular (4:1) rigid waveguide tubing. Standard wall thickness. General application category. (15th March 1971) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (12 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
45. Detail specification for ordinary rectangular (2:1) rigid waveguide tubing. Standard wall thickness. General application category. (15th February 1971) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (14 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
46. Detail specification for silicon n-p-n high frequency planar transistor. (15th March 1971) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (12 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
47. Detail specification for solder-sealed quartz crystal units for oscillator applications. AA, BF, CX and BC/1 enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges. Fundamental thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level. (15th October 1977) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (12 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
48. Detail specification for solder-sealed quartz crystal units for oscillator applications. AA, CX and BC/1 enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges. Fundamental thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level. (15th June 1977) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (10 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
49. Detail specification for solder-sealed quartz crystal units for oscillator applications. AA, CX and BC/1 enclosures, 17 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level. (15th June 1977) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (10 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
50. Detail specification for solder-sealed quartz crystal units for oscillator applications. AA, CX and BC/1 enclosures, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level. (15th June 1977) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (9 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗