1. Reduction of systematic errors in structured light metrology at discontinuities in surface reflectivity. (January 2019) Authors: Yue, Huimin; Dantanarayana, Harshana G.; Wu, Yuxiang; Huntley, Jonathan M. Journal: Optics and lasers in engineering Issue: Volume 112(2019) Page Start: 68 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗