1. Phase change memory : device physics, reliability and applications /: device physics, reliability and applications. ([2018]) Editors: Redaelli, Andrea Record Type: Book Extent: 1 online resource (342 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Thermophysical properties and measuring technique of Ge-Sb-Te alloys for phase change memory. (2020) Other Names: Lan, Rui Record Type: Book Extent: 1 online resource (145 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗