1. Investigating PID shunting in polycrystalline silicon modules via multiscale, multitechnique characterization. (27th February 2018) Authors: Harvey, Steven P.; Moseley, John; Norman, Andrew; Stokes, Adam; Gorman, Brian; Hacke, Peter; Johnston, Steve; Al‐Jassim, Mowafak Journal: Progress in photovoltaics Issue: Volume 26:Number 6(2018) Page Start: 377 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗