1. A framework for inspection of dies attachment on PCB utilizing machine learning techniques. Issue 2 (3rd April 2018) Authors: Vafeiadis, Thanasis; Dimitriou, Nikolaos; Ioannidis, Dimosthenis; Wotherspoon, Tracy; Tinker, Gregory; Tzovaras, Dimitrios Journal: Journal of management analytics Issue: Volume 5:Issue 2(2018) Page Start: 81 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗