21. Quartz crystal controlled oscillators of assessed quality. Phase jitter measurement method for quartz crystal oscillators and SAW oscillators. Application guidelines Part 6, (30th June 2011) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (26 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
22. Quartz crystal controlled oscillators of assessed quality. Standard outlines and lead connections Part 3, (19th February 2002) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (38 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
23. Quartz crystal controlled oscillators of assessed quality. Standard outlines and lead connections Part 3, (31st July 2013) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (28 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
24. Rules for the preparation of detail specifications for semiconductor devices of assessed quality: microwave avalanche oscillators (c.w. operation). (15th October 1977) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (10 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
25. Rules for the preparation of detail specifications for semiconductor devices of assessed quality: microwave avalanche oscillators (pulse operation). (15th October 1977) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (10 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
26. Rules for the preparation of detail specifications for semiconductor devices of assessed quality: microwave Gunn oscillators (c.w. operation). (15th September 1977) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (10 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
27. Rules for the preparation of detail specifications for semiconductor devices of assessed quality: microwave Gunn oscillators (pulse operation). (15th September 1977) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (12 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
28. Semiconductor devices. Discrete devices. Bipolar transistors Part 7, (23rd October 2019) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (104 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
29. Sintered metal materials and hardmetals. Determination of Young modulus. (15th June 1993) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (10 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
30. Specification for quartz crystal oscillators of assessed quality: generic data and methods of test. (31st December 1982) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (138 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗