1. Effectiveness of a hardware-based approach to detect resistive-open defects in SRAM cells under process variations. (December 2016) Authors: Gomez, A.F.; Lavratti, F.; Medeiros, G.; Sartori, M.; Poehls, L. Bolzani; Champac, V.; Vargas, F. Journal: Microelectronics and reliability Issue: Volume 67(2016) Page Start: 150 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗