1. Quantification of the likelihood of single event multiple transients in logic circuits in bulk CMOS technology. (February 2018) Authors: Rao, Nanditha P.; Desai, Madhav P. Journal: Microelectronics journal Issue: Volume 72(2018) Page Start: 86 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗