1. Convolutional neural network-based method for real-time orientation indexing of measured electron backscatter diffraction patterns. (15th May 2019) Authors: Shen, Yu-Feng; Pokharel, Reeju; Nizolek, Thomas J.; Kumar, Anil; Lookman, Turab Journal: Acta materialia Issue: Volume 170(2019) Page Start: 118 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗