Subject: Microelectronics -- Ultrasound -- EFIT simulations -- TSVs - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Subject Microelectronics -- Ultrasound -- EFIT simulations -- TSVs

1. Automatized failure analysis of tungsten coated TSVs via scanning acoustic microscopy. (September 2016)

Authors:: Grünwald, E.; Rosc, J.; Hammer, R.; Czurratis, P.; Koch, M.; Kraft, J.; Schrank, F.; Brunner, R.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 370
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

2. Automatized failure analysis of tungsten coated TSVs via scanning acoustic microscopy. (September 2016)

Authors:: Grünwald, E.; Rosc, J.; Hammer, R.; Czurratis, P.; Koch, M.; Kraft, J.; Schrank, F.; Brunner, R.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 370
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗