771. Comparators in nanometer CMOS technology. ([2014]) Authors: Goll, Bernhard; Zimmermann, Horst Record Type: Book Extent: 1 online resource (xiv, 250 pages), illustrations (some color) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
772. Comparing bulk-Si FinFET and gate-all-around FETs for the 5 nm technology node. (January 2021) Authors: Vashishtha, Vinay; Clark, Lawrence T. Journal: Microelectronics journal Issue: Volume 107(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
773. Comparison between three approximation methods on oscillator circuits. (November 2018) Authors: Elwy, Omar; Rashad, Somia H.; Said, Lobna A.; Radwan, Ahmed G. Journal: Microelectronics journal Issue: Volume 81(2018) Page Start: 162 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
774. Comparison in radiation tolerance between FLR planar junction termination and positive bevel edge termination for power diodes. (October 2022) Authors: Liao, Xinfang; Liu, Yi; Xu, Changqing; Wang, Chen; Yang, Yintang Journal: Microelectronics journal Issue: Volume 128(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
775. Comparison of Green׳s function solutions for different heat conduction models in electronic nanostructures. Issue 12 (December 2015) Authors: Janicki, Marcin; Samson, Agnieszka; Raszkowski, Tomasz; Zubert, Mariusz; Napieralski, Andrzej Journal: Microelectronics journal Issue: Volume 46:Issue 12 Part A (2015) Page Start: 1162 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
776. Compensation of self-heating-induced timing errors in bipolar comparators. (January 2016) Authors: Webb, Kyle M.; Kalkur, T.S. Journal: Microelectronics journal Issue: Volume 47(2016) Page Start: 31 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
777. Complex oscillations and two-parameter bifurcations of a memristive circuit with diode bridge rectifier. (November 2019) Authors: Sadecki, Jan; Marszalek, Wieslaw Journal: Microelectronics journal Issue: Volume 93(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
778. Comprehensive assessment of MEMS double touch mode capacitive pressure sensor on utilization of SiC film as primary sensing element: Mathematical modelling and numerical simulation. (March 2018) Authors: Jindal, Sumit Kumar; Varma, M. Aditya; Thukral, Deepali Journal: Microelectronics journal Issue: Volume 73(2018) Page Start: 30 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
779. Comprehensive characterization of vertical GaN-on-GaN Schottky barrier diodes. (October 2022) Authors: Raja, P. Vigneshwara; Raynaud, Christophe; Sonneville, Camille; Eric N'Dohi, Atse Julien; Morel, Hervé; Phung, Luong Viet; Ngo, Thi Huong; De Mierry, Philippe; Frayssinet, Eric; Maher, Hassan; Tasselli, Josiane; Isoird, Karine; Morancho, Frédéric; Cordier, Yvon; Planson, Dominique Journal: Microelectronics journal Issue: Volume 128(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
780. Comprehensive doping scheme for MOSFETs in ultra-low-power subthreshold circuits design. (June 2016) Authors: Hossain, Munem; Chowdhury, Masud H. Journal: Microelectronics journal Issue: Volume 52(2016) Page Start: 73 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗