661. Analysis design of area efficient segmentation digital to analog converter for ultra-low power successive approximation analog to digital converter. (June 2016) Authors: Sharuddin, Iffa; Lee, L.; Yusof, Zubaida Journal: Microelectronics journal Issue: Volume 52(2016) Page Start: 80 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
662. Analysis of device capacitance and subthreshold behavior of Tri-gate SOI FinFET. (April 2017) Authors: Es-Sakhi, Azzedin; Chowdhury, Masud Journal: Microelectronics journal Issue: Volume 62(2017) Page Start: 30 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
663. Analysis of I–V-T characteristics of Be-doped AlGaAs Schottky diodes grown on (100) GaAs substrates by molecular beam epitaxy. (April 2022) Authors: Oussalah, Slimane; Filali, Walid; Garoudja, Elyes; Zatout, Boumediene; Lekoui, Fouaz; Amrani, Rachid; Sengouga, Noureddine; Henini, Mohamed Journal: Microelectronics journal Issue: Volume 122(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
664. Analysis of nanoscale digital circuits using novel drain-gate underlap DMG hetero-dielectric TFET. (January 2022) Authors: Gracia, D.; Nirmal, D.; Moni, D. Jackuline Journal: Microelectronics journal Issue: Volume 119(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
665. Analysis of performance for novel pocket-doped NCFET under the influence of interface trap charges and temperature variation. (September 2022) Authors: Malvika, ; Choudhuri, Bijit; Mummaneni, Kavicharan Journal: Microelectronics journal Issue: Volume 127(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
666. Analysis of propagation delay and repeater insertion in single-walled carbon nanotube bundle interconnects. (August 2016) Authors: Lu, Qijun; Zhu, Zhangming; Yang, Yintang; Ding, Ruixue Journal: Microelectronics journal Issue: Volume 54(2016) Page Start: 85 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
667. Analysis of propagation delay and repeater insertion in single-walled carbon nanotube bundle interconnects. (August 2016) Authors: Lu, Qijun; Zhu, Zhangming; Yang, Yintang; Ding, Ruixue Journal: Microelectronics journal Issue: Volume 54(2016) Page Start: 85 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
668. Analysis of solder joint reliability of high power LEDs by transient thermal testing and transient finite element simulations. Issue 12 (December 2015) Authors: Elger, Gordon; Kandaswamy, Shri Vishnu; Liu, E.; Hanss, Alexander; Schmid, Maximilian; Derix, Robert; Conti, Fosca Journal: Microelectronics journal Issue: Volume 46:Issue 12 Part A (2015) Page Start: 1230 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
669. Analysis of zero-temperature coefficient behavior on vertically stacked double nanosheet nMOS devices. (November 2021) Authors: Coelho, Carlos H.S.; Martino, Joao A.; Bellodi, Marcello; Simoen, Eddy; Veloso, Anabela; Agopian, Paula G.D. Journal: Microelectronics journal Issue: Volume 117(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
670. Analysis on electrical parameters including temperature and interface trap charges in gate overlap Ge source step shape double gate TFET. (December 2022) Authors: Saha, Rajesh; Goswami, Rupam; Panda, Deepak Kumar Journal: Microelectronics journal Issue: Volume 130(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗