1. Numerical modeling of radiation-induced charge neutralization in MOS devices. (April 2022) Authors: Sambuco Salomone, L.; Garcia-Inza, M.; Carbonetto, S.; Lipovetzky, J.; Redin, E.; Faigón, A. Journal: Radiation measurements Issue: Volume 153(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗