1. Improvement of MOSFET matching characterization with calibrated multiplexed test structure. Issue 9 (August 2015) Authors: Welter, L.; Scotto di Quaquero, J.L.; Dreux, P.; Lopez, L.; Aziza, H.; Portal, J.M. Journal: Microelectronics and reliability Issue: Volume 55:Issue 9/10(2015) Page Start: 1328 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗