1. Rules for the preparation of detail specifications for integrated circuits of assessed quality: DTL digital gate circuits (general application category). (1st December 1972) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (16 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Rules for the preparation of detail specifications for integrated circuits of assessed quality: TTL digital gate circuits. General application category. (1st December 1975) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (11 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Rules for the preparation of detail specifications for integrated circuits of assessed quality: TTL digital interconnected gate circuits. General application category. (18th October 1985) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (18 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Methods for assessing the performance characteristics of ultrasonic flaw detection equipment. Electrical performance Part 2, (14th January 1972) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (14 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Graphical symbols for electrical power, telecommunications and electronics diagrams. Guide for binary logic elements Part 12, (30th August 1991) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (248 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗