1. Impact of resistive paths on NVM array reliability: Application to Flash & ReRAM memories. (September 2016) Authors: Canet, P.; Postel-Pellerin, J.; Aziza, H. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 36 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Impact of resistive paths on NVM array reliability: Application to Flash & ReRAM memories. (September 2016) Authors: Canet, P.; Postel-Pellerin, J.; Aziza, H. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 36 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗