1. Automated defect detection for fast evaluation of real inline CT scans. Issue 3 (2nd July 2020) Authors: Schlotterbeck, Maxim; Schulte, Lukas; Alkhaldi, Weaam; Krenkel, Martin; Toeppe, Eno; Tschechne, Stephan; Wojek, Christian Journal: Nondestructive testing and evaluation Issue: Volume 35:Issue 3(2020) Page Start: 266 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗