Subject: IGZTO TFTs -- Back-Channel-Etch -- Reliability - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Subject IGZTO TFTs -- Back-Channel-Etch -- Reliability

1. 21‐2: Highly Reliable Amorphous Indium‐Gallium‐Zinc‐Tin‐Oxide TFTs with Back‐Channel‐Etch Structure. Issue 1 (2nd June 2017)

Authors:: Lu, Xin-Hong; Wang, Ke; Hu, Hehe; Zhang, Wenlin; Ning, Ce; Yang, Wei; Wang, Jiushi; Yao, Qi; Cao, Zhanfeng; Yuan, Guangcai; Huang, Yinglong
Journal:: Digest of technical papers
Issue:: Volume 48:Issue 1(2017)
Page Start:: 291
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

2. 21‐2: Highly Reliable Amorphous Indium‐Gallium‐Zinc‐Tin‐Oxide TFTs with Back‐Channel‐Etch Structure. Issue 1 (May 2017)

Authors:: Lu, Xin-Hong; Wang, Ke; Hu, Hehe; Zhang, Wenlin; Ning, Ce; Yang, Wei; Wang, Jiushi; Yao, Qi; Cao, Zhanfeng; Yuan, Guangcai; Huang, Yinglong
Journal:: Digest of technical papers
Issue:: Volume 48:Issue 1(2017)
Page Start:: 291
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗