1. A real-time aging monitoring method of parallel-connected IGBT modules. (15th March 2021) Authors: Yuan, Weibo; He, Yigang; Li, Zhigang; Ruan, Yi; Lu, Li; Li, Bing Journal: Materials science in semiconductor processing Issue: Volume 124(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗