1. Reliability analysis of a novel IEC 61850-9-2 process-bus based substation automation system architecture. Issue 1 (2nd January 2020) Authors: Gupta, Sunil; Gandhar, Abhishek; Tiwari, Mohit Journal: Journal of statistics & management systems Issue: Volume 23:Issue 1(2020) Page Start: 65 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗