1. EXAFS study of local structure contributing to Sn stability in SiyGe1-y-zSnz. (1st November 2017) Authors: Shimura, Yosuke; Asano, Takanori; Yamaha, Takashi; Fukuda, Masahiro; Takeuchi, Wakana; Nakatsuka, Osamu; Zaima, Shigeaki Journal: Materials science in semiconductor processing Issue: Volume 70(2017) Page Start: 133 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗