1. Replica Bit-Line Technique for Internal Refresh in Logic-Compatible Gain-Cell Embedded DRAM. (July 2020) Authors: Harel, Odem; Nachum, Yarden; Giterman, Robert Journal: Microelectronics journal Issue: Volume 101(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗