1. Coeffect of trapping behaviors on the performance of GaN-based devices *Project supported by the National Natural Science Foundation of China (Nos. 61604137, 61674130). (September 2018) Authors: Zhou, Xingye; Tan, Xin; Wang, Yuangang; Song, Xubo; Xu, Peng; Gu, Guodong; Lü, Yuanjie; Feng, Zhihong Journal: Journal of semiconductors Issue: Volume 39:Number 9(2018:Sep.) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗