1. Atomic-scale imaging of dopant atoms in Si-doped GaN. (15th November 2022) Authors: Liu, Huan; Xu, Lei; Xiao, Lei; Wu, Chenchen; Wang, Jing; Qi, Junjie Journal: Materials science in semiconductor processing Issue: Volume 151(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗