1. Analysis of zero-temperature coefficient behavior on vertically stacked double nanosheet nMOS devices. (November 2021) Authors: Coelho, Carlos H.S.; Martino, Joao A.; Bellodi, Marcello; Simoen, Eddy; Veloso, Anabela; Agopian, Paula G.D. Journal: Microelectronics journal Issue: Volume 117(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗