1. Gate mapping impact on variability robustness in FinFET technology. (September 2019) Authors: Brendler, L.H.; Zimpeck, A.L.; Meinhardt, C.; Reis, R.A.L. Journal: Microelectronics and reliability Issue: Volume 100/101(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗