1. The Characterization of Errors in an FPGA-Based RISC-V Processor due to Single Event Transients. (May 2022) Authors: Sharma, Jhalak; Rao, Nanditha Journal: Microelectronics journal Issue: Volume 123(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗