1. Dynamic reliability management based on resource-based EM modeling for multi-core microprocessors. (April 2018) Authors: Kim, Taeyoung; Liu, Zao; Tan, Sheldon X.-D. Journal: Microelectronics journal Issue: Volume 74(2018) Page Start: 106 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗