1. Investigation of VDMOSFET's switching power dissipation changes under constant electrical stress. (August 2018) Authors: Sezgin-Ugranlı, Hatice Gül; Özçelep, Yasin Journal: Microelectronics journal Issue: Volume 78(2018) Page Start: 81 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗