1. Ultra-small MOSFETs: The Importance of the Full Coulomb Interaction on Device Characteristics. Issue 1 (2001) Authors: Gross, W. J.; Vasileska, D.; Ferry, D. K. Journal: VLSI design Issue: Volume 13:Issue 1/4(2001) Page Start: 75 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗