31. Rules for the preparation of detail specifications for capacitively coupled digital integrated circuits of assessed quality. Full assessment level. (31st July 1979) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (12 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
32. Rules for the preparation of detail specifications for fusible link programmable read-only memories of assessed quality (full assessment level). (15th October 1981) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (19 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
33. Rules for the preparation of detail specifications for integrated circuits of assessed quality which perform mixed digital and/or analogue functions. (15th April 1981) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (6 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
34. Rules for the preparation of detail specifications for integrated circuits of assessed quality: complex digital circuits - bipolar. General application category. (1st December 1975) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (18 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
35. Rules for the preparation of detail specifications for integrated circuits of assessed quality: DTL digital gate circuits (general application category). (1st December 1972) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (16 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
36. Rules for the preparation of detail specifications for integrated circuits of assessed quality: DTL digital inverter circuits. General application category. (1st December 1975) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (18 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
37. Rules for the preparation of detail specifications for integrated circuits of assessed quality: insulated gate shift registers. General application category. (1st December 1975) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (13 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
38. Rules for the preparation of detail specifications for integrated circuits of assessed quality: TTL binary counter circuits. General application category. (1st December 1973) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (18 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
39. Rules for the preparation of detail specifications for integrated circuits of assessed quality: TTL binary memory circuits. General application category. (1st December 1975) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (20 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
40. Rules for the preparation of detail specifications for integrated circuits of assessed quality: TTL digital bistable circuits. General application category. (1st December 1972) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (18 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗