11. Rules for the preparation of detail specifications for fusible link programmable read-only memories of assessed quality (full assessment level). (15th October 1981) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (19 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
12. Specification for harmonized system of quality assessment for electronic components. Family specification. Digital integrated HC MOS circuits series HC/HCT/HCU. (15th November 1986) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (32 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
13. Rules for the preparation of detail specifications for integrated circuits of assessed quality: TTL binary counter circuits. General application category. (1st December 1973) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (18 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
14. Rules for the preparation of detail specifications for integrated circuits of assessed quality: DTL digital inverter circuits. General application category. (1st December 1975) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (18 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
15. Specification for harmonized system of quality assessment for electronic components. Blank detail specification: digital microprocessor integrated circuits. (15th May 1987) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (27 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
16. Rules for the preparation of detail specifications for integrated circuits of assessed quality: TTL digital interconnected gate circuits. General application category. (18th October 1985) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (18 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
17. Rules for the preparation of detail specifications for integrated circuits of assessed quality: TTL binary memory circuits. General application category. (1st December 1975) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (20 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
18. Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL low power SCHOTTKY circuits, series 54LS, 64LS, 74LS, 84LS. (2nd June 1987) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (23 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
19. Rules for the preparation of detail specifications for integrated circuits of assessed quality: insulated gate shift registers. General application category. (1st December 1975) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (13 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
20. Apparatus for connection to private circuits run by certain public telecommunication operators. Specification for apparatus for connection to digital circuits with interfaces according to CCITT G-series Recommendations. Section 8.1: G.703 services at 2 048 kbits/s and 8 448 kbits/s Part 8.1, (15th August 2000) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (24 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗