1. Dielectric engineering of Ge nanocrystal/SiO2 nanocomposite thin films with Ge ion implantation: Modeling and measurement. (15th October 2015) Authors: Liu, Zhen; Yang, Ming; Chen, T.P.; Liu, Yang; Zhang, Hai Yan Journal: Materials & design Issue: Volume 83(2016:Jul.) Page Start: 713 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗