1. Thermal stress probing the channel-length modulation effect of nano n-type FinFETs. (April 2018) Authors: Tuan, Fu-Yuan; Chen, Chii-Wen; Wang, Mu-Chun; Liao, Wen-Shiang; Wang, Shea-Jue; Fan, Shou-Kong; Lan, Wen-How Journal: Microelectronics and reliability Issue: Volume 83(2018) Page Start: 260 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗