1. A fault-analysis oriented re-design and cost-effectiveness evaluation methodology for error tolerant applications. (August 2017) Authors: Hsieh, Tong-Yu; Li, Kuan-Hsien; Chung, Chen-Chia Journal: Microelectronics journal Issue: Volume 66(2017) Page Start: 48 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗