1. Statistical estimation of delay in nano-scale CMOS circuits using Burr Distribution. (September 2018) Authors: Moshrefi, Amirhossein; Aghababa, Hossein; Shoaei, Omid Journal: Microelectronics journal Issue: Volume 79(2018) Page Start: 30 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗