1. A pixel-level deep segmentation network for automatic defect detection. (1st April 2023) Authors: Yang, Lei; Xu, Shuai; Fan, Junfeng; Li, En; Liu, Yanhong Journal: Expert systems with applications Issue: Volume 215(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗