1. 28 nm CMOS process ESD protection based on diode-triggered silicon controlled rectifier. (November 2017) Authors: Li, Xiang; Dong, Shurong; Jin, Hao; Miao, Meng; Hu, Tao; Guo, Wei; Wong, Hei Journal: Solid-state electronics Issue: Volume 137(2017) Page Start: 128 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗