1. Analyzing the impact of guard-ring on different dual-direction SCR by device simulation and TLP measurement. (November 2021) Authors: Wang, Yang; Li, Jieyu; Jia, DanDan; Wei, Weipeng Journal: Microelectronics and reliability Issue: Volume 126(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗