1. The Investigation on Single Event Function Failure for DC/DC Converters with Three Single Terminal Topological Structures. Issue 6 (1st November 2016) Authors: Li, Pengwei; Wang, Wenyan; Luo, Lei; Yu, Qingkui; Tang, Min; Du, Feipeng; Liu, Jie Journal: Chinese journal of electronics Issue: Volume 25:Issue 6(2016) Page Start: 1097 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗