1. An enhanced MOSFET threshold voltage model for the 6–300 K temperature range. (February 2017) Authors: Dao, Nguyen Cong; Kass, Abdallah El; Azghadi, Mostafa Rahimi; Jin, Craig T.; Scott, Jonathan; Leong, Philip H.W. Journal: Microelectronics and reliability Issue: Volume 69(2017) Page Start: 36 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗