1. A data-driven approach based on wavelet analysis and deep learning for identification of multiple-cracked beam structures under moving load. (1st October 2020) Authors: Nguyen, Thanh Q.; Vuong, Luan C.; Le, Canh M.; Ngo, Nhi K.; Nguyen- Xuan, H. Journal: Measurement Issue: Volume 162(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗