1. Contamination of electronic assemblies. (2003) Other Names: Pecht, Michael Record Type: Book Extent: 1 online resource (216 pages), illustrations View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Formation Testing : Low Mobility Pressure Transient Analysis /: Low Mobility Pressure Transient Analysis. ([2016]) Authors: Chin, Wilson C; Zhou, Yanmin; Feng, Yongren; (Control engineer), Yu, Qiang Record Type: Book Extent: 1 online resource, illustrations View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Formation testing : supercharge, pressure testing, and contamination models /: supercharge, pressure testing, and contamination models. (2019) Authors: Chin, Wilson C Record Type: Book Extent: 1 online resource View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Impurities in engineering materials : impact, reliability, and control /: impact, reliability, and control. (2017) Other Names: Briant, C. L Record Type: Book Extent: 1 online resource (320 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗