1. Current injection from metal to MoS2 probed at nanoscale by conductive atomic force microscopy. (February 2016) Authors: Giannazzo, F.; Fisichella, G.; Piazza, A.; Di Franco, S.; Oliveri, I.P.; Agnello, S.; Roccaforte, F. Journal: Materials science in semiconductor processing Issue: Volume 42:Part 2(2016:Feb.) Page Start: 174 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗