1. Accurate reliability analysis of concurrent checking circuits employing an efficient analytical method. Issue 3 (February 2015) Authors: An, T.; Liu, K.; Cai, H.; de B. Naviner, L.A. Journal: Microelectronics and reliability Issue: Volume 55:Issue 3/4(2015) Page Start: 696 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗