261. Tracked Changes. Electrical equipment for measurement, control and laboratory use. EMC requirements. General requirements Part 1, (14th June 2021) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (64 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
262. Tracked Changes. Ergonomics. 3-D scanning methodologies for internationally compatible anthropometric databases. Evaluation protocol of surface shape and repeatability of relative landmark positions Part 2, (27th September 2023) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (71 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
263. Tracked Changes. Information technology. Information security incident management. Guidelines to plan and prepare for incident response Part 2, (7th March 2023) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (160 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
264. Tracked Changes. Information technology. Service management. Guidance on the application of service management systems Part 2, (27th November 2019) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (248 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
265. Understanding the century date change problem. (15th March 1998) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (10 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
266. Universal serial bus interfaces for data and power. Common components. USB Power Delivery specification Part 1-2, (26th October 2022) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (712 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
267. VLSI design and test : 21st International Symposium, VDAT 2017, Roorkee, India, June 29-July 2, 2017, Revised selected papers /: 21st International Symposium, VDAT 2017, Roorkee, India, June 29-July 2, 2017, Revised selected papers. (2017) Editors: Kaushik, Brajesh Kumar; Dasgupta, Sudeb; Singh, Virendra Other Names: VDAT (Symposium), 21st Record Type: Book Extent: 1 online resource (xxi, 815 pages), illustrations View Content: Available online (eLD content is only available in our Reading Rooms) ↗
268. VLSI Design and Test : 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers /: 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers. (2019) Editors: Rajaram, S; Balamurugan, N.B; Gracia Nirmala Rani, D; Singh, Virendra Record Type: Book Extent: 1 online resource (722 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
269. VLSI-SoC : at the crossroads of emerging trends : 21st IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2013, Istanbul, Turkey, October 6-9, 2013, Revised and extended selected papers /: at the crossroads of emerging trends : 21st IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2013, Istanbul, Turkey, October 6-9, 2013, Revised and extended selected papers. (2015) Editors: Orailoglu, A (Alex), 1954-; Ugurdag, H. Fatih; Silveira, Luis Miguel; Margala, Martin; Reis, Ricardo A. L (Ricardo Augusto da Luz) Other Names: IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, 21st Record Type: Book Extent: 1 online resource (xiv, 270 pages), illustrations View Content: Available online (eLD content is only available in our Reading Rooms) ↗
270. VLSI-SoC : design for reliability, security, and low power : 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised selected papers /: design for reliability, security, and low power : 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised selected papers. (2016) Editors: Shin, Youngsoo; Tsui, Chi-Ying; Kim, Jae-Joon; Choi, Kiyoung; Reis, Ricardo Other Names: International Conference on Very Large Scale Integration, 23rd Record Type: Book Extent: 1 online resource (xiii, 223 pages), illustrations View Content: Available online (eLD content is only available in our Reading Rooms) ↗